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OMI PRODUCT FAMILY
KEY APPLICATIONS
Laser Testing
Wavefront Analysis
Beam Profiling
Optical Alignment
Lens Inspection
QUICK SPECIFICATIONS
Resolution45 x 45 spots
Wavelength RangeVis - SWIR
Accuracyλ/80
Repeatabilityλ/1200
SpeedUp to 50 Hz
OMI: Test in Single Pass
PRODUCT DETAILSHigh resolution sensors for wavefront measurement and analysis. Available lenslet arrays: Pitch: 0.15,0.3,0.5 mm, Focal lengths: 7-41 mm (*)
- Metrology in transmission (single pass) of lasers and optical elements
- Large wavelength range (DUV, Vis, SWIR, MWIR and LWIR)
- High repeatability (λ/1000) and accuracy (λ/60)
- Compact and lightweight
- Calibration unit included
- SenSoft software for Shack-Hartmann image acquisition and analysis
- Wide range of accessories for testing different beam sizes
- Calibration done by user in-situ for high accuracy