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High resolution sensors for wavefront measurement and analysis. Available lenslet arrays: Pitch: 0.15,0.2,0.3,0.5 mm, Focal lengths: 7-41 mm (*)
Compact Shack-Hartmann wavefront sensor designed for portable, high-precision metrology in research and industrial environments.
Dual-channel Shack-Hartmann wavefront sensor combining direct imaging and high-accuracy wavefront analysis for alignment and testing.
Laser-focused metrology solution combining direct imaging and Shack-Hartmann analysis for beam quality, M², and MTF evaluation.
Versatile Shack-Hartmann platform for transmission measurements across a broad wavelength range and multiple optical configurations.
On-axis motorized metrology platforms featuring accurate Z-movement, XY and tilt stages for easy lens centering, and in-built calibration units.
On-axis and off-axis motorized metrology solutions for precise transmission testing, featuring high-accuracy encoders, macro-defined field positions, and automatic scanning.
Accurate and fast contact lens metrology solution designed for the production line. Extremely compact, lightweight, and capable of testing in wet and dry conditions with no moving parts.
Powerful dual-channel metrology solution to optimize telescope performance, featuring specialized tools for alignment, mirror mountings, and image quality evaluation. Can cover focal ratios from f/5 to f/18
Advanced multi-camera metrology solution for simultaneous on-axis and off-axis testing in a single shot. Ideal for the production line and active alignment of composite optical elements without mechanical scanning.
